B-LAB

NON-DESTRUCTIVE CURRENT IMAGING

Direction and strength of electric currents

Analyze electric currents contactlessly and quantitatively by area-resolved Magnetic Field Imaging (MFI) technology.

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Product benefits:


  • Shorten R&D cycle time
  • Customizable for your applications
  • Gain new scientific insights, increase your academic reputations

Product features:


  • Quantitative magnetic field imaging, area resolved, contactless and in real-time
  • Acces to DENKwelt platform for data visualization and advanced analysis
  • User-friedly interface, easy handling

Measurement examples:

BROKEN CROSS CONNECTOR

  • Measurement of a solar cell
  • The right busbar is not connected to the cross-connector

MICRO CRACK

  • Measurement of a solar cell with micro crack
  • The crack is clearly visible
  • Below the crack no solder joints are visible any more
  • The rift cut through the bus bars here

SOLDERING JOINTS

  • Measurement of a cell
  • The solder points become visible in the by-component of the magnetic field
  • Some solder points are missing
  • It can also be determined whether the solder points are also located centrally on the pad

CYLINDRIC CELL

  • Measurement of three cylindrical Li-Ion batteries during one charging process
  • The battery on the right shows an abnormality
  • The changed magnetic field indicates a locally changed current flow
  • MFI thus allows the detection of defects in accumulators

POUCH CELL

  • Measurement of a pouch cell during a charging process
  • MFI allows for the first time to visualize the current flow

Specifications:


  • Magnetic field resolution: 0.3 μT (i.e. currents down to 50 mA)
  • Spatial resolution: 2.5 mm (x), μm range (y, z)
  • Individual sensor length, system sizes up to 1 m x 2 m
  • Power supply 230 V, 50/60 Hz, 8 A
  • 3-Axis magnetic field sensor